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Microstructural
Characterization Facility
Image Analysis Laboratory
This laboratory facility includes both automatic and semi-automatic image analysis instrumentation. The
Zeiss Video plan System, coupled with a Zeiss ICM 405 inverted light microscope, handles all functions of quantitative microscopy on a semi-automated basis. The Video plan performs routine data acquisition, storage
and manipulations. Measurements of area, diameter, angle, length, centroid, and form factor can be made, as well as the digitizing of irregular curves such as fracture profiles. This instrument significantly reduces
the level of effort necessary to quantitatively analyze micrographs or curves, and plays a central role in our analyses for quantitative fractography.
Contact: Dr. Arun Gokhale
X-Ray Diffraction Characterization Facilty
The MSE X-Ray Diffraction Characterization Facility, located on the ground floor of the IPST building (room 135)
houses three state of the art PANalytical X-Pert Pro x-ray diffractometers in it’s spacious laboratory. The three diffractometers include the rare Alpha-1 which has an incident beam Johannsson monochromator,
the MPD which as two high temperature furnaces and a rapid, 15-sample sample changer, and lastly the MRD with a 4-circle goniometer, incident and diffracted beam multilayer optics, incident beam bartells
monochromator, poly and monocapillary optics, and triple axis diffracted beam monochromator.
The functionality of the instruments is greatly multiplied by PANalytical’s revolutionary “PREFIX” optics system whereby instrument optics may be reconfigured with little more than a turn of a set screw, and an instrument may be changed from diverging beam optics to parallel beam optics in less than 5 minutes, while still being completely aligned. The extensive range of measurements that can be performed from these instruments range from phase identification, crystal structure refinement, diffraction peak profile analysis, thermal expansion analysis, unit cell refinement, quantitative analysis, high temperature diffraction, texture and pole figure analysis, residual stress analysis, rocking curve and reciprocal space mapping.
Contact: Dr. Robert Snyder
Surface Analysis Facilities
State-of-the-art 6762t surface analysis facilities
are available to researchers in the School of Materials Engineering at Georgia Tech's Micro Electronics Center. This center is located across the street from the Materials Engineering Building. An Atomic A-DiDA-3000
Secondary Ion Mass Spectrometry (SIMS) apparatus is available for sensitive determination of atomic composition variation with depth and position in a specimen. Depth resolutions of 10 nm are typical and elemental
sensitivities of 1014cm-3 are achieved in many cases. Elemental distribution can be mapped with a 3-micron lateral spatial resolution. The Micro-electronics Research Center also has state-of-the-art equipment for
conducting Scanning Auger Multiprobe Microscopy (SAM - Physical Electronics Model 600), Electron Spectroscopy for Chemical Analysis (ESCA - Surface Science Model SSX-100 with small spot ESCA spectrometer), angle
resolved Auger spectroscopy and Ultraviolet Photoelectron Spectroscopy (UPS). These techniques allow researchers to obtain elemental and chemical composition data from the outer few atomic layers of most solids. In
combination with inert gas ion sputtering they also provide information on composition as a function of depth beneath the surface.
Contact: Dr. Brent Carter
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