 Center for Nanostructure Characterization
The Center for Nanostructure Characterization in the School of Materials Science and Engineering, is
a multi-user facility. Its mission is to provide the Georgia Tech campus with state-of-the-art electron microscopy tools.
Instruments
Scanning Electron Microscopes:
Transmission Electron Microscopes:
Atomic Force Microscope (AFM) by Digital Instruments
Location: Room 176, Love Manufacturing Bldg.
Used to observe and quantitatively characterize the surface topography of specimens with
vertical resolutions in the range of one nanometer
quantify surface damage in metallic specimens, such as fatigue damage due to cyclic
loading for tribological studies and for studying corrosion behavior in metallic materials
NanoIndenter XP by MTS Systems
Location: Room 176, Love Manufacturing Bldg.
For investigating the mechanical properties of materials by indenting the test material with a
diamond tip to depths of 100 to 1000 nano-meters while measuring the force-displacement response
X-Ray Diffractometers
Facility Description
Georgia Tech has acquired a Hitachi HF-2000 field emission gun (FEG) transmission electron microscope (TEM) (200 kV), purchased with a total joint (equal) investment of $1.5M by the National
Science Foundation and the State of Georgia. This is one of the few instruments in the United States capable of performing high spatial-resolution chemical microanalysis, high-resolution lattice
imaging and high-coherent beam holographic imaging. The HF-2000 is equipped with a thin window energy dispersive x-ray spectrometer (EDS) which detects not only heavier elements but also
elements as light as carbon, a Gatan parallel-detection electron energy-loss spectrometer (PEELS) which can be applied not only for quantitative chemical microanalysis of light elements but also for
studying atom bonding in solid materials at an energy resolution better than 0.6 eV, and a 180º rotational electrostatic biprism suitable for electron holography. The high-brightness and highly
coherent source of the Hitachi HF-2000 TEM allows high-resolution lattice imaging at a point-to-point image resolution better than 0.23 nm and lattice resolution of 1.0 nm (smaller or equivalent to
interatomic distances in solid state materials), and also chemical microanalysis at a spatial resolution better than 20 nm. This is an ideal instrument for studies of nanostructured materials and
interfaces in thin film and composite materials. More importantly, the holographic imaging is the only technique which can be applied to retrieve electron phase information after interaction with a
specimen, and it is ideally suited for quantitative mapping of electrostatic fields and magnetic fields in materials of technological importance, such as ferroelectric and magnetic recording materials.
The experimental images are recorded digitally using a charge couple device (CCD) camera, which allows subsequent processing and quantitative modeling.
The Center for Nanostructure Characterization (CNC) also has two scanning electron microscopes (SEMs) and two additional TEMs. The LEO 1530 thermally-assisted FEG SEM has superb resolution
and image quality at low operating voltages: 3 nm at 1 kV. The integral Windows control system allows for minimal readjustments while operating in the voltage ranges 200 V to 30 kV. The high
probe current and stability makes it ideally suited for EBSD pattern acquisition and the in-lens annular detector yields clear, bright surface-specific images. The Hitachi S800 FEG scanning
electron microscopy (SEM), can be used to image the morphology of materials at a resolution better than 3.0 nm and to perform chemical microanalysis from bulk specimens. The JEOL 4000EX HREM
(400 kV), which routinely gives a point-to-point image resolution of 0.18 nm and is best suited for recording high-resolution images of thin foil specimens. These instruments are versatile,
comprehensive, and have uniquely positioned Georgia Tech beyond most of the major US universities in capability to perform advanced research.
The instruments are being used to perform advanced research on a variety of materials. Advanced graduate courses are available in MSE to provide fundamental theories and techniques associated
with these instruments. A full time senior scientist is available for training students, coordinating and equipment maintenance.
For more information, please contact
Z. L. Wang, Director
Tel. (404) 894-8008; Fax (404) 894-9140
Yolande Berta, Research Scientist
Tel. (404) 894-2545
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