Yolande Berta Senior Research Scientist Electron Microscopy Coordinator Georgia Institute of Technology School of Materials Science and Engineering 771 Ferst Drive, N.W. Atlanta, GA 30332-0245 Office: Love Room 172 Phone: 404.894.2545 yolande.berta@mse.gatech.edu Selected Publications “Measuring the Aspect Ratios of ZnO Nanobelts,” Micron, 33, 2002, 687-691, with C. Ma and Z.L. Wang “Structure Characterization of Colossal Magnetoresistive Oxides,” Proceedings of Microscopy and Microanalysis, 1998, G.W. Bailey, K.B. Alexander, W.G. Jerome, M.G. Bond, and J.J. McCarthy (Eds.),1998, 4:572-573, with D.B. Studebaker, M. Todd, T.H. Baum, and Z.L. Wang. “Carbon-Induced UV Sensitivity in Aluminum Nitride,” Proceedings of Microscopy and Microanalysis, 1998, G.W. Bailey, K.B. Alexander, W.G. Jerome, M.G. Bond, and J.J. McCarthy (Eds.), 1998, 4:570-571, with R. A. Gerhardt. ” Microstructure of Porous Silicon Thin Films,” Proceedings of Microscopy and Microanalysis, 1998, G.W. Bailey, K.B. Alexander, W.G. Jerome, M.G. Bond, and J.J. McCarthy (Eds.),1998, 4:632-633, with R.A. Gerhardt. "Effect of Na2O Additions in the Crystallization of Barium Ferrite from a BaO-B2O3-Fe2O3Glass," Journal of the American Ceramic Society, 79:1, 1996, 183-192, with C. K. Lee and R. F. Speyer. "Enhanced Surface Hardness in Nitrogen-Implanted Silicon Carbide," Nucl. Instrum. Methods in Phys. Res. B, 118, 1996, 693-697, with D. H. Lee, B. Park and C. Uslu.